Applied Reliability
Since the publication of the second edition of Applied Reliability in 1995, the ready availability of inexpensive, powerful statistical software has changed the way statisticians and engineers look at and analyze all kinds of data. Problems in reliability that were once difficult and time consuming even for experts can now be solved with a few well
1136541912
Applied Reliability
Since the publication of the second edition of Applied Reliability in 1995, the ready availability of inexpensive, powerful statistical software has changed the way statisticians and engineers look at and analyze all kinds of data. Problems in reliability that were once difficult and time consuming even for experts can now be solved with a few well
59.99 In Stock
Applied Reliability

Applied Reliability

Applied Reliability

Applied Reliability

eBook

$59.99 

Available on Compatible NOOK devices, the free NOOK App and in My Digital Library.
WANT A NOOK?  Explore Now

Related collections and offers


Overview

Since the publication of the second edition of Applied Reliability in 1995, the ready availability of inexpensive, powerful statistical software has changed the way statisticians and engineers look at and analyze all kinds of data. Problems in reliability that were once difficult and time consuming even for experts can now be solved with a few well

Product Details

ISBN-13: 9781439897256
Publisher: CRC Press
Publication date: 08/26/2011
Sold by: Barnes & Noble
Format: eBook
Pages: 600
File size: 28 MB
Note: This product may take a few minutes to download.

About the Author

Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society's Lifetime Achievement Award.

Table of Contents

Basic Descriptive Statistics. Reliability ConceptsExponential Distribution. Weibull Distribution. The Normal and Lognormal Distributions. Reliability Data Plotting. Analysis of Multicensored Data. Physical Acceleration Models. Alternative Reliability Models. System Failure Modeling: Bottom-Up Approach. Quality Control in Reliability: Applications of Discrete Distributions. Repairable Systems Part I: Nonparametric Analysis and Renewal Processes. Repairable Systems Part II: Nonrenewal Processes. Bayesian Reliability Evaluation. Answers to Selected Exercises. References. Index.
From the B&N Reads Blog

Customer Reviews

OSZAR »